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논문

Direct sampling method for identifying magnetic inhomogeneities in limited-aperture inverse scattering problem

등록일자 :

https://doi.org/10.1016/j.camwa.2020.10.009

  • 저자Won-Kwang Park,안치영,하태영
  • 학술지Computers and Mathematics with Applications (0898-1221), 80(12), 2811 ~ 2829
  • 등재유형SCIE
  • 게재일자 20201215
The direct sampling method (DSM) in limited-aperture inverse scattering problems for transverse electric (TE) polarization is considered. Based on the asymptotic expansion formula in the presence of small targets, we demonstrate that the indicator function of DSM can be represented by an infinite series of Bessel functions of integer order and correspondingly examine various properties of DSM.

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